| BREWER SCIENCE | spin coaters, carbon nanotube coating, waferbond, antireflective coating, benchtop spin coat, planarization system, workstation exhaust enclosure and mini environment |
| Cryogenic Control Systems | cryogenic temperature controllers, cryogenic temperature monitors, cryogenic temperature sensors |
| FILMETRICS | thin film thickness meters (ex-situ and in-situ), etch monitor, thickness mapping, metrology system |
| GATAN | TEM sample preparation and imaging, TEM CCD, ion beam milling, specimen holders, SEM cryotransfer, cathodoluminescence, SEM cold stage, heating stage, 3D view imaging, X-ray microscopy, nanoimaging |
| MAD CITY LABS | nanopositionings labs, sub-nm resolution, tilt and rotation stages, single and multi-axis systems, AFM instrumentation, nanoprobe instrumentation, SPM instrumentation, resonant SPM, micro-mirror TIRF, |
| MEIVAC | magnetron sputtering guns, high temperature substrate heaters, vacuum throttle valves, power supplies |
| MODU-LASER | argon lasers, krypton lasers, mixed gas laser heads, |
| OXFORD APPLIED RESEARCH | thin film deposition and measurement systems: atom, ion sources and electron sources, mini e- beam evaporators, nanocluster sources, gas dosers, magnetrons, piezoelectric leak valves, ion milling systems, SMOLED evaporation system for glovebox operation, mass spectrometer, nanoclustering |
| PHOTONIC SCIENCE LTD | x-ray cameras, x-ray detectors, neutron cameras, euv, vuv, ccd cameras, intensified ccd, cooled ccd, emccd cameras, swir cameras, ingaas cameras |
| SEMICONSOFT | Thin Film measurement, thickness, ellipsometers, reflectomers, nanometrology |
| SensaDyne | Computer-based instruments for intermittent and continuous measurement of dynamic and equilibrium (static) fluid surface tension |
| TELEMARK | deposition rate controllers,e guns, thickness monitors, sputtering heads, PVD, e beam evaporators , E-Beam Sources, E-Beam Power Supplies, Water Vapor Cryotraps, Optical & Plasma Monitors, Quartz Crystal Deposition Controllers |
| Wenman Scientific Corp. | porometer, particle characterization, pore size measurement, porometry, ultrasonic interferometry; contamination, concentration, and viscosity analyzers in liquids |
| ZYVEX | nanomanipulator, nanoprobes, nanomanipulator system for EM, semiconductor failure analysis |
Valley Research Does Work As Distributor With Many Other Manufacturers in Asia, Europe and NorthAmerica.
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