AIP | hot isostatic presses, cold isostatic presses, sintering systems, high temp furnaces |
APPLIED NANOFLOURESCENCE LLC | Carbon nanotube characterization, near-IR fluorescence, SWCNT analysis, Raman spectroscopy, multi-mode spectrometer, nanoflourometry |
Cryogenic Control Systems | cryogenic temperature controllers, cryogenic temperature monitors, cryogenic temperature sensors |
EDMUND BUEHLER | melt spinners, splat quenchers, mini arc melters, arc melters, high temperature X-Ray diffraction chambers, low temperature X-Ray diffraction chambers, heat zone furnaces, rapid quencher from the solid state, copper boat, induction melters, casting options
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GMW Associates | magnetic field generation, magnetic field measurement, NMR teslameter,, Hall effect teslameter, field sensors, magnetometer, ion sources, magnetic susceptibility, precision current transducers, transformers, electromagnets; |
MODU-LASER | argon lasers, krypton lasers, mixed gas laser heads, |
OPTOTHERM | Infrared cameras, thermal imaging systems, infrared microscope,
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OXY-GON INDUSTRIES INC | gas purification furnaces, regenerative gettering furnaces, univeral application furnaces, bottom loading furnaces, general purpose furnaces, hot press furnace systems, fiber draw furnaces, end loading tube furnaces, top loading furnaces, crystal growth furnaces, tensile testing furnaces, molybdenum furnace elements, tungsten furnace elements |
PHOTONIC SCIENCE LTD | x-ray cameras, x-ray detectors, neutron cameras, euv, vuv, ccd cameras, intensified ccd, cooled ccd, emccd cameras, swir cameras, ingaas cameras |
SEMICONSOFT | Thin Film measurement, thickness, ellipsometers, reflectomers, nanometrology |
ULVAC | Etching System , Asher, Sputter System, Dry Etching System, Rapid Thermal Annealing System – RTA , Infrared Lamp Heating System ,Arc Plasma Deposition System AC calorimeters (Helium), IR furnaces, thermophysical properties measurement systems, thermal simulation systems, Seebeck analyzer, RTP furnace, sintering/annealing microscope, cryorefrigerator, Thermal Dilatometer, Laser Flash Thermal Constants Measuring System, Omega Method Nano Thin Film Thermal Conductivity Meter, AC Method Thermal Diffusivity Measuring System, Scanning Thermal Probe Measurement Instrument – STPM, Seebeck Coefficient/Electric Resistance Measuring System, Spectroscopic Ellipsometer, Scanning XPS Microprobe, Scanning Auger NanoProbe, Time-of-Flight Secondary Ion Mass Spectrometer, Helium Leak Detector, |
Valley Research Does Work As Distributor With Many Other Manufacturers in Asia, Europe and NorthAmerica.
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